Brand: GATAN Name and Model: MonoCL4 New Generation Cathodoluminescence System

Manufacturer: GATAN Company Distributor: Obotong Co., Ltd

Model 450

Monarc ™— The ability to characterize cathodoluminescence (CL) on scanning electron microscopy (SEM) has been redefined.

Through groundbreaking optical path design, Monarc has significantly increased sensitivity and spectral resolution, resulting in unique wavelength angle resolution capabilities that enable you to perform more complete cathodoluminescence (CL) characterization analysis. As a new generation of CL detectors, Monarc brings new insights into high demand applications such as nanophotonics, optoelectronics, and geological sciences

Performance advantages:

Quickly obtain high-quality data:

Collect CL data with excellent spatial resolution (<10 nm="" 1="" br="">(0.1 nm)

Collect CL data with both angle and wavelength resolution capabilities

Compared to previous generation technology, it can collect hyperspectral data up to 30 times faster
Hyperspectral data

Easy to operate:

• Obtain optimized results through fully automated optical path alignment and formula driven operations

The constantly aligned optical path brings reproducible results for both short-term and long-term work

• Big vision improves data collection throughput and simplifies user workflow

Accurate correlation with other signals:

Simultaneously detect multiple signals and correlate physical properties or composition information with CL data for imaging

No need for compromise - make full use of SEM's in lens probe while conducting CL measurements

Figure 1 This polarization filtered CL image demonstrates that Monarc can provide CL data with spatial resolution better than 10 nm. The image comes from the color superposition of two sets of orthogonal linear polarized luminescence of star shaped gold nanoparticles with a size of around 100 nm.

Featured features:

Angle resolved CL (ARCL): Understanding the interaction between light and matter at scales far below the optical diffraction limit - compared to previous technologies, 400x provides a larger field of view without actual resolution loss (patent application pending)

• Wavelength and angle resolved CL (WARCL): visualizes the interaction between light and matter across multiple observation angles and wavelengths - thanks to optical path design, previously unattainable or very difficult to achieve characterization methods have become routine work on Monarc

Polarization filtering: Obtain the luminescence polarization performance of deep sub wavelength structures such as nanoantennas and photonic crystals in the optical band

Application fields:

• Research and development of optoelectronic materials

LED and laser failure analysis

• Display and Lighting

Basic research on light matter interaction

Nanophotonics

• Photonic crystals

• Geological Sciences - Distribution of Trace Elements

• Characterization of Photovoltaic Materials

• Fluorescence technology

Monarc is equipped with two different models to meet different application needs:

Monarc
Suitable for geological science and surface distribution imaging applications, the Monarc model has a larger field of view that is not affected by spectral resolution, and through its novel wavelength filtering spectral imaging capability, provides higher spatial sampling hyperspectral data acquisition, greatly surpassing the performance of SEM CL detectors based on previous generation technology.

Monarc Pro
For applications in nanophotonics and optoelectronic materials, Monarc Pro is more suitable as it provides higher sensitivity and spectral resolution; And it has unique wavelength angle resolution analysis capabilities and polarization filtering options.

Figure 2 Composite wavelength filtered images obtained from GaN/InGaN multi quantum well samples containing V-pit defects using Monarc were extracted from hyperspectral data blocks (red=504 ± 2 nm, green=435 ± 2 nm, purple=365 ± 2 nm).

Figure 3 By utilizing Monarc's unique wavelength angle resolution spectroscopy mode, the luminescence performance of thin film InGaN based LEDs is almost fully characterized. The mutual interference between emitted light and reflected light forms an emission pattern that varies with the emission wavelength.